ISBN: 0824700805 Author: J.C. Riviere Publisher: CRC Publication Date: 1998-01-27 Number Of Pages: 1000 Average Amazon Rating:
Editorial Description Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function. 下载连接：http://rapidshare.de/files/10517858/JRiviere.rar Password (if any): www.AvaxHome.ru
